Issue |
E3S Web Conf.
Volume 88, 2019
i-DUST 2018 – Inter-Disciplinary Underground Science & Technology
|
|
---|---|---|
Article Number | 06002 | |
Number of page(s) | 8 | |
Section | Modeling | |
DOI | https://doi.org/10.1051/e3sconf/20198806002 | |
Published online | 22 February 2019 |
SITARe: a fast simulation tool for the analysis of disruptive effects on electronics
1
EMMAH, UMR 1114, INRA-Université d’Avignon et Pays du Vaucluse, 33 rue Louis Pasteur, UFR Sciences, 84000 Avignon, France
2
Aix-Marseille University, CNRS, IM2NP, Marseille, France
* Corresponding author: karine.coulie@univ-amu.fr
This paper is devoted to an exhaustive presentation of a fast computation numerical tool, dedicated to the simulation of transient currents induced by stochastic events in microelectronic devices. This is a part of a numerical platform, SITARe, combining a spice simulator with the semi-analytical model presented here. The paper describes the theoretical model, the calibration. An instance of application illustrates the ability of the tool.
© The Authors, published by EDP Sciences, 2019
This is an open access article distributed under the terms of the Creative Commons Attribution License 4.0 (http://creativecommons.org/licenses/by/4.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.