Open Access
E3S Web Conf.
Volume 12, 2016
i-DUST 2016 – Inter-Disciplinary Underground Science & Technology
Article Number 04004
Number of page(s) 9
Section Microelectronics Materials, Devices and Systems
Published online 05 December 2016
  1. W. Brown and J. Brewer, “Nonvolatile semiconductor memory technology: a comprehensive guide to understanding and to using NVSM devices”, IEEE Press, 1998 [Google Scholar]
  2. P. Canet, R. Bouchakour, N. Harabech, P. Boivin and J.-M. Mirabel, “Eeprom programming study-time and degradation aspects”, Proc. of IEEE ISCAS, pp. 846–849, 2001 [Google Scholar]
  3. R. Laffont, R. Bouchakour, O. Pizzuto and J.-M. Mirabel, “A 0.18 um flash source side erasing improvement”, Proc. of IEEE NVMTS, pp. 105–109, 2004 [Google Scholar]
  4. P. Canet, R. Bouchakour, N. Harabech, P. Boivin, J.-M. Mirabel and C. Plossu, “Study of signal programming to improve eeprom cells reliability”, Proc. of IEEE MWSCAS, pp. 1144–1147, 2000 [Google Scholar]
  5. P. Canet, R. Bouchakour, J. Razafindramora, F. Lalande and J.-M. Mirabel, “Very fast eeprom erasing study”, Proc. of IEEE ESSCIRC, pp. 683–686, 2002 [Google Scholar]
  6. ITRS, “Process Integration, Devices, and Structures”, 2013 [Google Scholar]
  7. B. Fishbein, D. Krakauer and B. Doyle, “Measurement of Very Low Tunneling Current Density in SiO, Using the Floating- Gate Technique”, IEEE Elec. Dev. Lett., 12, no. 12, pp. 713–715, 1991 [CrossRef] [Google Scholar]
  8. F.H. Gaensslen and J.M. Aitken, “Sensitive Technique for Mea- suring Small MOS Gate Currents”, IEEE Elec. Dev. Lett., 1, no. 11, pp. 231–233, 1980 [CrossRef] [Google Scholar]
  9. Keysight B1500A Semiconductor Device Analyzer data sheet, October 2016 [Google Scholar]
  10. S. Burignat, “Mécanismes de transport, courants de fuite ultra-faibles et rétention dans les mémoires non volatiles à grille flottante”, PhD thesis, INSA Lyon (France), 2004 [Google Scholar]
  11. J. Postel-Pellerin, G. Micolau, P. Chiquet, J. Melkonian, G. Just, D. Boyer and C. Ginoux, “Setting up of a floating gate test bench in a low noise environment to measure very low tunneling currents”, Acta Imeko, 4, no. 3, pp. 36–41, 2015 [CrossRef] [Google Scholar]
  12. J. Postel-Pellerin, G. Micolau, C. Abbas, P. Chiquet and A. Cavaillou, “Robustness of the floating-gate technique in a very low-noise environment”, Proc. of IEEE CAS, pp. 287–290, 2014 [Google Scholar]
  13. M.-C. Néel, A. Zoia, M. Joelson, A. Cartalade and M. Fleury, “Fractional p.d.e and stochastic processes for dispersion: application to porous media”, Proc. of “Dynamiques fractionnaires et Applications” Conference, 2010 [Google Scholar]
  14. J. Golder, M. Joelson and M.-C. Néel, “Mass transport with sorption in porous media”, Mathematics and Computers in Simulation, 81, pp. 2181–2189, 2011 [Google Scholar]
  15. J. Golder, M. Joelson, M.-C. Néel and L. Di Pietro, “A time fractional model to represent rainfall process”, Water Sci. and Engineering, 7, no. 1, pp.32–40, 2014 [Google Scholar]
  16. N. Laskin, “Fractional Poisson Process” Communication in Nonlinear Science and Numerical Simulation, 8, pp. 201–213, 2003 [Google Scholar]
  17. D. Sierociuk, I. Podlubny and I. Petras “Experimental Evidence of Variable-Order Behavior of Ladders and Nested Ladders”. IEEE Transactions on Control Systems Technology 21(2), 2011 [Google Scholar]
  18. Kilbas AA, Saigo M, “Generalized Mittag-Leffer function and generalized fractional calculus operators”. Integral Transform Spec. Func. 15(1):31–49, 2004 [Google Scholar]